发明名称 Test reading apparatus for memories
摘要 Test reading apparatus having a memory device having individual memory cells, a buffer device, which is connected to the memory device, and which stores data written to the memory cells in the memory device, an apparatus which has an input and an output, at least one test reference source which can be connected to the input of the apparatus by data stored in the buffer device, and a test apparatus, which is connected to the buffer device and to the output of the apparatus, and which is designed to compare a signal at the output of the apparatus with data stored in the buffer device.
申请公布号 US2004260989(A1) 申请公布日期 2004.12.23
申请号 US20040871523 申请日期 2004.06.17
申请人 INFINEON TECHNOLOGIES AG 发明人 DIRSCHERL GERD;SEDLAK HOLGER;SCHLAGER TOBIAS
分类号 G11C16/34;(IPC1-7):G01R31/28 主分类号 G11C16/34
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