发明名称 OPERATING MICROSCOPE STAND FOR X-Y DISPLACEMENT
摘要 The invention concerns a stand for a microscope (6), having an X-Y displacement unit (5), a stand beam (3), a stand column (2), and a stand foot (1), the X-Y displacement unit (5) being no longer arranged, as before, in the region of microscope (6), but rather removed therefrom in the direction of the stand column (2). The X-Y displacement unit thus carries at least a part of the stand beam (3). The location of the center of gravity on the stand is thereby favorably influenced. Both the stand beam (3) and the stand foot (1) can be small.
申请公布号 EP1101139(B1) 申请公布日期 2004.12.15
申请号 EP19990938378 申请日期 1999.07.30
申请人 LEICA MICROSYSTEMS (SCHWEIZ) AG 发明人 PENSEL, JUERGEN
分类号 G02B21/24;A61B19/00;A61F9/007;G02B7/00;G02B21/00 主分类号 G02B21/24
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