发明名称 Testing circuit and method for phase-locked loop
摘要 A testing circuit and method for a phase-locked loop allow measurement of leakage currents in the phase-locked loop components. By forcing the output of the phase-frequency detector to a particular state, the charge pump can be disabled. This disables the effect of feedback in the phase-locked loop, and allowing the output frequency to be determined by the voltage on the control voltage node at the time the feedback is disabled. If there is no leakage, the control voltage, and therefore the output frequency, should remain the same as they were at the moment feedback was disabled. Monitoring the output frequency for changes provides an indication of the presence or absence of leakage. Conducting the test using two different charge pump reference currents allows one to detect leakage resulting from charge pump mismatch.
申请公布号 US6832173(B1) 申请公布日期 2004.12.14
申请号 US20020209633 申请日期 2002.07.30
申请人 ALTERA CORPORATION 发明人 STARR GREGORY;CHANG WANLI
分类号 G01R35/00;H03L7/06;H03L7/089;(IPC1-7):G01R35/00 主分类号 G01R35/00
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