发明名称 |
Polishing method and polishing liquid |
摘要 |
The present invention relates to a polishing method and a polishing liquid for polishing a workpiece such as a semiconductor wafer with a fixed abrasive. In the polishing method for polishing a workpiece by pressing the workpiece to be polished against a fixed abrasive and bringing the workpiece in sliding contact with the fixed abrasive, the workpiece is polished while supplying a polishing liquid which contains an anionic surface-active agent and does not contain abrasive particles.
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申请公布号 |
US2004248415(A1) |
申请公布日期 |
2004.12.09 |
申请号 |
US20040485349 |
申请日期 |
2004.07.08 |
申请人 |
WADA YUTAKA;AKATSUKA TOMOHIKO;SASAKI TATSUYA;HAGIHARA TOSHIYA |
发明人 |
WADA YUTAKA;AKATSUKA TOMOHIKO;SASAKI TATSUYA;HAGIHARA TOSHIYA |
分类号 |
B24B7/22;B24B37/04;B24B49/12;B24B53/007;B24B53/02;C09G1/00;H01L21/304;H01L21/3105;(IPC1-7):H01L21/302;H01L21/461 |
主分类号 |
B24B7/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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