发明名称 Semiconductor device, its manufacturing method, and radio communication device
摘要 The variation of the parasitic inductance generated at the output terminal of a transistor in the final stage of a multistage amplifier unit is reduced. One side of the semiconductor chip that includes the final stage transistor is put in contact with the inner wall of a square recess formed in a wiring substrate. The semiconductor chip is positioned and fixed accurately at the bottom of the recess, whereby the drain wire of the transistor is fixed. Then, a chip edge at which the drain electrode is disposed on top of the chip is put in contact with the inner wall of the recess, which is closer to the drain bonding pad. A metallized layer is formed of the same size as that of the chip at the bottom of the recess and a fusion bonding material is supplied on the metallized layer.
申请公布号 US2004245655(A1) 申请公布日期 2004.12.09
申请号 US20040486707 申请日期 2004.02.13
申请人 IDA TSUTOMU;KOBAYASHI YOSHIHIKO;HASHIZUME MASAKAZU;SHIOKAWA YOSHINORI;KIKUCHI SAKAE 发明人 IDA TSUTOMU;KOBAYASHI YOSHIHIKO;HASHIZUME MASAKAZU;SHIOKAWA YOSHINORI;KIKUCHI SAKAE
分类号 H01L21/60;H01L23/13;H01L23/66;H01L25/065;(IPC1-7):H01L23/52;H01L23/48;H01L29/40 主分类号 H01L21/60
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