发明名称
摘要 <P>PROBLEM TO BE SOLVED: To enhance an accuracy and efficiency of measuring a negative ion in a plasma. <P>SOLUTION: The plasma 10 is irradiated with a sheet-like laser 2 of a sectional rectangular shape becoming thin by comparing a thickness direction with a widthwise direction. A probe 3 is inserted into a part irradiated with the sheet-like laser 2 in the plasma 10 from one surface F1 to the other surface F2 of a pair of surfaces opposed to the thickness direction (x-axis direction) of the sheet-like laser 2. Electrons optically released from negative ion in the plasma 10 by irradiating are collected by the probe 3, and a density of the negative ion is measured by measuring the collected optically released electron current. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP3595546(B2) 申请公布日期 2004.12.02
申请号 JP20020171329 申请日期 2002.06.12
申请人 发明人
分类号 H05H1/00 主分类号 H05H1/00
代理机构 代理人
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