| 摘要 |
PROBLEM TO BE SOLVED: To provide a transition-tracking method that can make an appropriate decision in a manufacturing test of a device, expressing non-deterministic clock delays. SOLUTION: This method includes a step for acquiring a first sample of a bit stream at a first sampling point of a first sampling sequence, a step for acquiring a second sample at a second sampling point of the first sampling sequence, and a step for acquiring a third sample at a third sampling point of the first sampling sequence. In addition, it also includes a step for evaluating, at least either of generation of transitions in a first time cycle demarcated by the first and second sampling points or that in a second time cycle demarcated by the second and third sampling points, and a step for adjusting the second sampling point to be shifted to around a timing, when a transition occurs. COPYRIGHT: (C)2005,JPO&NCIPI
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