发明名称 Semiconductor device and production method therefor
摘要 It is an object to provide an insulating film having a very low dielectric constant and a great mechanical strength. Moreover, it is another object to provide a semiconductor device capable of reducing both a capacity between wiring layers and a capacity between wirings also in microfabrication and an increase in integration in the semiconductor device. In order to attain the objects, there is provided an inorganic insulating film comprising a porous structure having a skeletal structure in which a vacancy is arranged periodically and a large number of small holes are included.
申请公布号 US2004242020(A1) 申请公布日期 2004.12.02
申请号 US20040482628 申请日期 2004.07.06
申请人 OKU YOSHIAKI 发明人 OKU YOSHIAKI
分类号 H01L23/522;H01L21/316;H01L21/768;H01L21/8246;H01L23/532;H01L27/105;(IPC1-7):H01L21/31 主分类号 H01L23/522
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