发明名称 METHOD FOR FORMING THE TOP PLATE OF A MIM CAPACITOR WITH A SINGLE MASK IN A COPPER DUAL DAMASCENE INTEGRATION SCHEME
摘要 <p>A method for forming a MIM capacitor and a MIM capacitor device formed by same. A preferred embodiment comprises selectively forming a first cap layer over a wafer including a MIM capacitor bottom plate, and depositing an insulating layer over the MIM capacitor bottom plate. The insulating layer is patterned with a MIM capacitor top plate pattern, and a MIM dielectric material is deposited over the patterned insulating layer. A conductive material is deposited over the MIM dielectric material, and the wafer is planarized to remove the conductive material and MIM dielectric material from the top surface of the insulating layer and form a MINI capacitor top plate. A second cap layer is selectively formed over the MIM capacitor top plate.</p>
申请公布号 WO2004100232(A1) 申请公布日期 2004.11.18
申请号 WO2004EP50716 申请日期 2004.05.05
申请人 INFINEON TECHNOLOGIES AG;BARTH, HANS-JOACHIM;FELSNER, PETRA;FRIESE, GERALD RUDOLF;KALTALIOGLU, ERDEM 发明人 BARTH, HANS-JOACHIM;FELSNER, PETRA;FRIESE, GERALD RUDOLF;KALTALIOGLU, ERDEM
分类号 H01L21/02;H01L21/285;H01L21/316;H01L21/318;H01L27/08;(IPC1-7):H01L21/02 主分类号 H01L21/02
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