发明名称 DECOUPLING CAPACITANCE CHANGE CIRCUIT, ESPECIALLY ONLY CHANGING THE TEST SIGNAL TO IMPROVE A POWER NOISE IMMUNITY
摘要 PURPOSE: A decoupling capacitance change circuit is provided to control the decoupling capacitance by using only the change of the test signal without correcting the metal layer circuit in controlling the decoupling capacitance to improve the power noise immunity. CONSTITUTION: A decoupling capacitance change circuit includes a decoder(210) and a capacitance adjustment circuit(220). The decoder(210) receives an address signal, a test mode generation signal and the test mode release signal and generates the capacitance change signal by the logic operation and the latching operation. And, the capacitance adjustment circuit(220) adjusts the decoupling capacitance between the power voltage and the ground voltage in response to the capacitance change signal.
申请公布号 KR20040095888(A) 申请公布日期 2004.11.16
申请号 KR20030026906 申请日期 2003.04.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAE, SEUNG CHEOL;CHOO, SIN HO
分类号 G11C11/40;(IPC1-7):G11C11/40 主分类号 G11C11/40
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