| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device in which power consumption of each redundancy relief discriminating circuit arranged at a plurality of blocks can be reduced. SOLUTION: A redundancy relief discriminating circuit Rk belonging to a plurality of blocks is constituted of a block discriminating part 131 and an address discriminating part 132. The address discriminating part 132 is provided with sub-address discriminating parts 133-0 to 133-n of (n+1) pieces and a logical operation part 135. Information whether a defective part exists in a memory cell array belonging to the same block or not is programmed in the block discriminating part 131. When a defective part exists, a block discriminating signal /BD is asserted. When the block discriminating signal /BD is asserted, each sub-address discriminating part 133-0 to 133-n performs operation discriminating whether inputted address signals A0Y-AnY indicate a defective part in a memory cell array or not. COPYRIGHT: (C)2005,JPO&NCIPI
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