发明名称 INSPECTION DEVICE OF IMAGE DISPLAY DEVICE, INSPECTION METHOD, AND IMAGE DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance efficiency and reliability of inspection of an image display device such as a TFT-LCD. SOLUTION: When a driving signal is written in one sample/hold circuit 12, writing potential is measured, the written driving signal is supplied to a pixel circuit 11 to drive the pixel circuit, the driven pixel circuit 11 and a direct connection circuit 15 are connected to each other and driving signal from the driven pixel circuit 11 is outputted. At this time, writing potential and reading potential are measured and inspected. Since the direct connection circuit 15 is provided at the image display device and the potential of the driven pixel circuit 11 can be directly measured, the efficiency and the reliability of the inspection can be enhanced. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004301918(A) 申请公布日期 2004.10.28
申请号 JP20030091956 申请日期 2003.03.28
申请人 SONY CORP 发明人 IZUMI TAKESHI;ASANO SHIN
分类号 G02F1/13;G02F1/133;G02F1/1345;G09F9/00;G09G3/20;G09G3/36;(IPC1-7):G02F1/13;G02F1/134 主分类号 G02F1/13
代理机构 代理人
主权项
地址