发明名称 Electrical inspection apparatus
摘要 An electrical inspection apparatus performs highly accurate electrical inspection using an inspection probe on any type of printed board without changing an instrument therefor. It comprises a reference position regulating member for positioning the printed board precisely at a predetermined reference position and a pressing member for pressing the printed board oppositely to the reference position regulating member. An inspected portion (e.g., a contact) of the printed board is fixed under tension and is precisely located at the reference position in planar condition by being contacted and positioned by the reference position regulating member, whereby it is subjected to electrical inspection using the inspection probe accompanied with the reference position regulating member and/or the pressing member. Thus, it is possible to prevent the inspection probe from being unexpectedly damaged or destroyed by excessive force that is produced due to inaccurate positioning therefor.
申请公布号 US2004207423(A1) 申请公布日期 2004.10.21
申请号 US20040761344 申请日期 2004.01.22
申请人 MIZOGUCHI YASUNORI;ISHII TORU;TSUCHIDA KENGO 发明人 MIZOGUCHI YASUNORI;ISHII TORU;TSUCHIDA KENGO
分类号 G01R31/02;G01R1/073;G01R31/28;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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