Semiconductor memory device capable of accessing all memory cells with relative addressing

摘要

A semiconductor memory device according to embodiments of the invention includes N channels for interface with an outside. During a test mode where the semiconductor memory device is tested by a tester having M channels, K ones of the N channels of the memory device are connected to the M channels of the tester, N being more than M and M being equal to or more than R*K (where R is an integer). <IMAGE>