| 摘要 |
A fault detection circuit for detecting an open and/or a short circuit fault at a sensor input. The fault detection circuit includes a current source that sends a nominal bias current through the sensor. The bias current is driven by an offset voltage and travels along a closed loop formed by the sensor and is maintained at a predetermined level by the bias current. If an open or short input condition occurs at the sensor input, the offset voltage will rise to maintain the level of the bias current. When the offset voltage increases above a selected tripping threshold, a fault signal is output to a processor, indicating the occurrence of the fault to a processor or other monitoring circuit.
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