发明名称 Contact temperature probe and process
摘要 A contact measurement probe for measuring a temperature of a substrate in a process environment includes a probe head having a contact surface made of a ceramic material or a polymeric material for contacting the substrate. The contact measurement probe eliminates electrical biasing effects in process environments that include an ion source, thereby providing greater accuracy and reproducibility in temperature measurement.
申请公布号 US6796711(B2) 申请公布日期 2004.09.28
申请号 US20020113554 申请日期 2002.03.29
申请人 AXCELIS TECHNOLOGIES, INC. 发明人 COLSON MICHAEL BRUCE;SRIVASTAVA ASEEM KUMAR
分类号 G01K1/12;G01K1/14;G01K1/18;(IPC1-7):G01K7/06;H01L35/08;H01L35/32 主分类号 G01K1/12
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