发明名称 Trench MOS device and process for radhard device
摘要 A MOSgated device is resistant to both high radiation and SEE environments. The active area of the device is formed of trench devices having a thin gate dielectric on the trench walls and a thicker dielectric on the trench bottoms over the device depletion region. Termination rings formed of ring-shaped trenches containing floating polysilicon plugs surrounds and terminates the device active area.
申请公布号 US6798016(B2) 申请公布日期 2004.09.28
申请号 US20010844958 申请日期 2001.04.27
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 BODEN, JR. MILTON J.
分类号 H01L29/04;H01L29/06;H01L29/10;H01L29/423;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/04
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