| 摘要 |
<P>PROBLEM TO BE SOLVED: To easily measure the eccentricity of a substrate for an optical disk even when the substrate has ≤30 nm track groove depth and ≤400 nm track pitch and realizes high density recording, and to provide an optical disk manufactured by using the substrate, a stamper used for manufacturing the substrate, a manufacturing method for the stamper and a method for measuring eccentricity of the substrate. <P>SOLUTION: Since a deep recessed part deeper than the recessed part in a user information recording area or a wide recessed part wider than the recessed part in the user information recording area are provided in the substrate for the optical disk, the eccentricity of the disk can be measured by utilizing a conventional method even when the track groove depth in the user information recording area is shallow and the track pitch in the area is narrow. Thereby, the substrate for the optical disk having low eccentricity can be obtained. The substrate for the optical disk, in particular, preferably has ≤30 μm<SB>p-p</SB>eccentricity. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
