发明名称 Accurate small-spot spectrometry systems and methods
摘要 The invention is a method and apparatus for determining characteristics of a sample. The system and method provide for detecting a monitor beam reflected off a mirror, where the monitor beam corresponds to the intensity of light incident upon the sample. The system and method also provide for detecting a measurement beam, where the measurement beam has been reflected off the sample being characterized. Both the monitor beam and the measurement beam are transmitted through the same transmission path, and detected by the same detector. Thus, potential sources of variations between the monitor beam and the measurement beam which are not due to the characteristics of the sample are minimized. Reflectivity information for the sample can be determined by comparing data corresponding to the measurement beam relative to data corresponding the monitor beam.
申请公布号 US2004174524(A1) 申请公布日期 2004.09.09
申请号 US20040796322 申请日期 2004.03.09
申请人 NORTON ADAM;SEZGINER ABDURRAHMAN;STANKE FRED E.;SMEDT RODNEY 发明人 NORTON ADAM;SEZGINER ABDURRAHMAN;STANKE FRED E.;SMEDT RODNEY
分类号 G01J3/08;G01J3/42;G01N21/55;(IPC1-7):G01J3/28 主分类号 G01J3/08
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