发明名称 Apparatus for method for immersion lithography
摘要 An apparatus for immersion lithography that includes an imaging lens which has a front surface, a wafer that has a top surface to be exposed positioned spaced-apart and juxtaposed to the front surface of the imaging lens, and a fluid that has a refractive index between about 1.0 and about 2.0 filling a gap formed in-between the front surface of the imaging lens and the top surface of the wafer. A method for immersion lithography can be carried out by flowing a fluid through a gap formed in-between the front surface of an imaging lens and a top surface of a wafer. The flow rate and temperature of the fluid can be controlled while particulate contaminants are filtered out by a filtering device.
申请公布号 US6788477(B2) 申请公布日期 2004.09.07
申请号 US20020278962 申请日期 2002.10.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN BURN JENG
分类号 G03F7/20;(IPC1-7):G02B7/02 主分类号 G03F7/20
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