发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device whose manufacturing cost is reduced by omitting a step of patterning a mask insulating film for selectively adding 15 group elements. SOLUTION: This manufacturing method of a semiconductor device is provided with a step of forming a base film 112 on a substrate 111; a step of forming a crystalline silicon film 113 containing impurity metal on the base film by forming an amorphous silicon film on the base film, applying a solution containing metal on the amorphous silicon film, and performing heat treatment; a step of forming a porous region 121 on the surface of the crystalline silicon film by anodizing the crystalline silicon film; a step for gettering by segregating the impurity metal in the crystalline silicon film in the porous region; and a step of eliminating the porous region. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004235504(A) 申请公布日期 2004.08.19
申请号 JP20030023359 申请日期 2003.01.31
申请人 SEMICONDUCTOR ENERGY LAB CO LTD;SHARP CORP 发明人 MAEKAWA SHINJI;GOTO MASAHITO
分类号 G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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