发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device whose manufacturing cost is reduced by omitting a step of patterning a mask insulating film for selectively adding 15 group elements. SOLUTION: This manufacturing method of a semiconductor device is provided with a step of forming a base film 112 on a substrate 111; a step of forming a crystalline silicon film 113 containing impurity metal on the base film by forming an amorphous silicon film on the base film, applying a solution containing metal on the amorphous silicon film, and performing heat treatment; a step of forming a porous region 121 on the surface of the crystalline silicon film by anodizing the crystalline silicon film; a step for gettering by segregating the impurity metal in the crystalline silicon film in the porous region; and a step of eliminating the porous region. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004235504(A) |
申请公布日期 |
2004.08.19 |
申请号 |
JP20030023359 |
申请日期 |
2003.01.31 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD;SHARP CORP |
发明人 |
MAEKAWA SHINJI;GOTO MASAHITO |
分类号 |
G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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