发明名称 BONDING PAD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A bonding pad of a semiconductor device is provided to concentrate pressure stress generated in a bonding process on the surface of a pad by forming unevenness of an embossed type on the pad in a CMP(chemical mechanical polishing) process. CONSTITUTION: An uppermost metal layer and an uppermost via hole are uniformly distributed in a bonding pad of a semiconductor device. The concave part and the convex part of the uppermost metal layer are formed of an embossed type. The uppermost metal layer constitutes a concave part in a region of a horizontal via hole(40).
申请公布号 KR20040070908(A) 申请公布日期 2004.08.11
申请号 KR20030007137 申请日期 2003.02.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BONG, WON HYEONG
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
代理机构 代理人
主权项
地址