发明名称 Methods of forming semiconductor structures, and articles and devices formed thereby
摘要 A method of forming a semiconductor structure is described that includes etching a first metal layer at the bottom of a via in a first insulating layer to expose a second metal layer, wherein the first metal layer is on the second metal layer, and wherein the etching of the first metal layer is not reactive-ion etching. Methods of making semiconductor devices and electronic devices are also described.
申请公布号 US6770566(B1) 申请公布日期 2004.08.03
申请号 US20020151127 申请日期 2002.05.16
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 AHN YONGCHUL;WONG KAICHIU
分类号 H01L21/311;H01L21/3213;(IPC1-7):H01L21/302 主分类号 H01L21/311
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