| 发明名称 |
Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductor |
| 摘要 |
A method of implementing a reference current measurement mode within a reference array programming mode or a reference array erase mode in a semiconductor chip is disclosed. This implementation leads to significant reduction in testing time for the semiconductor chip, increasing production volume and revenues.
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| 申请公布号 |
US6771093(B1) |
申请公布日期 |
2004.08.03 |
| 申请号 |
US20020254381 |
申请日期 |
2002.09.25 |
| 申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
BAUTISTA, JR. EDWARD V.;CHEAH KEN CHEONG;LEE WENG FOOK |
| 分类号 |
G01R31/30;G01R31/3185;(IPC1-7):H03K19/00 |
主分类号 |
G01R31/30 |
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