发明名称 THERMOELECTRIC UNIT FOR CHECK OF THICKNESS OF LAYERS OF DOUBLE-LAYER CONDUCTING MATERIALS
摘要 FIELD: measurement technology. ^ SUBSTANCE: proposed device is provided with thermal screen surrounding hot measuring thermal probe which is electrically insulated from it; thermal probe is provided with heater and is made in form of hollow thick-walled metal cylinder manufactured from high-conducting material for forming thermal field with isothermal surfaces; one surface coincides with interface of layers. Located in body of screen are additional heater and auxiliary thermal probe which is also electrically insulated from thermal screen. ^ EFFECT: reduction of measurement error due to thermal protection of measuring channel. ^ 2 dwg
申请公布号 RU2233441(C1) 申请公布日期 2004.07.27
申请号 RU20030108467 申请日期 2003.03.26
申请人 发明人 KORNDORF S.F.;NOGACHEVA T.I.;UGLOVA N.V.
分类号 G01N25/32;G01B7/06 主分类号 G01N25/32
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