发明名称 |
THERMOELECTRIC UNIT FOR CHECK OF THICKNESS OF LAYERS OF DOUBLE-LAYER CONDUCTING MATERIALS |
摘要 |
FIELD: measurement technology. ^ SUBSTANCE: proposed device is provided with thermal screen surrounding hot measuring thermal probe which is electrically insulated from it; thermal probe is provided with heater and is made in form of hollow thick-walled metal cylinder manufactured from high-conducting material for forming thermal field with isothermal surfaces; one surface coincides with interface of layers. Located in body of screen are additional heater and auxiliary thermal probe which is also electrically insulated from thermal screen. ^ EFFECT: reduction of measurement error due to thermal protection of measuring channel. ^ 2 dwg |
申请公布号 |
RU2233441(C1) |
申请公布日期 |
2004.07.27 |
申请号 |
RU20030108467 |
申请日期 |
2003.03.26 |
申请人 |
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发明人 |
KORNDORF S.F.;NOGACHEVA T.I.;UGLOVA N.V. |
分类号 |
G01N25/32;G01B7/06 |
主分类号 |
G01N25/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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