发明名称 |
Production of a trench capacitor for a semiconductor memory cell comprises forming a trench in a substrate using a hard mask, forming a capacitor dielectric, insulating collar and conducting filler in trench regions, and further processing |
摘要 |
Production of a trench capacitor comprises forming a trench (5) in a substrate (1) using a hard mask (2, 3), forming a capacitor dielectric (30), an insulating collar (10) and an electrically conducting filler (20, 40) in the upper and lower trench regions, forming a liner on the hard mask and in the trench, implanting impurity ions into the trench using the hard mask, forming a liner mask to define a contact region and an insulating region of the trench contact, and completing the connecting region (KS) and the insulating region of the trench contact by removing and replacing a part of the filler and/or a part of the collar using the liner mask.
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申请公布号 |
DE10255845(B3) |
申请公布日期 |
2004.07.15 |
申请号 |
DE20021055845 |
申请日期 |
2002.11.29 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
POPP, MARTIN;SCHLOESSER, TILL;LUETZEN, JOERN;KUDELKA, STEPHAN;MOLL, HANS-PETER;HEINECK, LARS;STEINMETZ, JOHANN |
分类号 |
H01L21/20;H01L21/334;H01L21/425;H01L21/8242;H01L27/108;H01L29/94;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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