发明名称 Production of a trench capacitor for a semiconductor memory cell comprises forming a trench in a substrate using a hard mask, forming a capacitor dielectric, insulating collar and conducting filler in trench regions, and further processing
摘要 Production of a trench capacitor comprises forming a trench (5) in a substrate (1) using a hard mask (2, 3), forming a capacitor dielectric (30), an insulating collar (10) and an electrically conducting filler (20, 40) in the upper and lower trench regions, forming a liner on the hard mask and in the trench, implanting impurity ions into the trench using the hard mask, forming a liner mask to define a contact region and an insulating region of the trench contact, and completing the connecting region (KS) and the insulating region of the trench contact by removing and replacing a part of the filler and/or a part of the collar using the liner mask.
申请公布号 DE10255845(B3) 申请公布日期 2004.07.15
申请号 DE20021055845 申请日期 2002.11.29
申请人 INFINEON TECHNOLOGIES AG 发明人 POPP, MARTIN;SCHLOESSER, TILL;LUETZEN, JOERN;KUDELKA, STEPHAN;MOLL, HANS-PETER;HEINECK, LARS;STEINMETZ, JOHANN
分类号 H01L21/20;H01L21/334;H01L21/425;H01L21/8242;H01L27/108;H01L29/94;(IPC1-7):H01L21/824 主分类号 H01L21/20
代理机构 代理人
主权项
地址