发明名称 Probe system
摘要 A probe system according to the present invention includes a probe unit and a loader unit which are adjacent to each other. The probe unit has a case defining a prober chamber for receiving an object to be tested, and a contact probe for testing the object received into the prober chamber. The loader unit has a case defining a loader chamber partially communicated with the prober chamber, and a carrying mechanism for carrying the object between the prober chamber and the loader chamber. In the loader unit, a main shielding cover for covering the carrying mechanism in the loader chamber is provided. The probe system is provided with means for supplying dry air into the interior of the main shielding cover of the loader unit and the prober chamber.
申请公布号 US6762616(B2) 申请公布日期 2004.07.13
申请号 US20020317088 申请日期 2002.12.12
申请人 TOKYO ELECTRON LIMITED 发明人 KAWAGUCHI KOJI;AMEMIYA HIROSHI;KANEKO HIROSHI;KAWASHIMA TATSUO
分类号 G01R31/26;G01R1/06;G01R31/28;H01L21/66;H01L21/677;(IPC1-7):G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址