发明名称 Testing integrated circuits and integrated power transistors
摘要 A switching regulator that has first, second, third and fourth terminals, a first power transistor disposed between the first terminal and a first node, a second power transistor disposed between the first node and a second node, a filter including a capacitor and an inductor, and a controller. The first power transistor is partitioned into a plurality of individually-addressable first transistor segments. The second node couples the second and fourth terminals. The second power transistor is partitioned into a plurality of individually-addressable second transistor segments. The inductor is disposed between the first node and the third terminal, and the capacitor is disposed between the third and fourth terminals. The controller is operable in a plurality of modes including a normal mode in which the controller opens and closes all of the first transistor segments and all of the second transistor segments, and a test mode in which the controller opens and closes less than all of the first transistor segments and all of the second transistor segments.
申请公布号 US6759856(B2) 申请公布日期 2004.07.06
申请号 US20030461844 申请日期 2003.06.12
申请人 VOLTERRA SEMICONDUCTOR, INC. 发明人 TSE LAWRENCE T.;DAVIS MICHAEL A.;STRATAKOS ANTHONY J.
分类号 G01R31/40;(IPC1-7):H01L21/66 主分类号 G01R31/40
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