发明名称 |
METHOD FOR FORMING DIELECTRIC LAYER AND METHOD FOR FABRICATING CAPACITOR USING THE SAME |
摘要 |
PURPOSE: A method for forming a dielectric layer and a method for fabricating a capacitor using the same are provided to increase the productivity of wafers and reduce the manufacturing cost by forming a multi-layered dielectric layer including an Al2O3 layer as a bottom layer within one chamber. CONSTITUTION: A semiconductor substrate(102) is loaded into an ALD(Atomic Layer Deposition) reactor(100). An Al2O3 layer(104a) is formed on a surface of the semiconductor substrate by supplying Al source gas and steam of H2O into the inside of the ALD reactor. A TiO2 layer(104b) is formed on a surface of the Al2O3 layer by supplying Ti source gas and O3 gas into the inside of the ALD reactor. The Ti source gas is formed with alkoxide-based Ti(O-iPr).
|
申请公布号 |
KR20040058902(A) |
申请公布日期 |
2004.07.05 |
申请号 |
KR20020085420 |
申请日期 |
2002.12.27 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, HEUNG JAE;HA, SEUNG CHEOL;KIL, DEOK SIN;LIM, GWAN YONG |
分类号 |
H01L21/20;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|