发明名称 Method to isolate device layer edges through mechanical spacing
摘要 An MRAM cell and a method of forming the an MRAM cell minimizes the occurrence of electrical shorts along the side walls of the stacked cell structure during fabrication. Specifically, a first conductor is provided in a trench in an insulating layer, and then an upper surface of the insulating layer and the first conductor are planarized. Next, as the layers forming the stacks of the MRAM cells are deposited on the planarized insulating layer and first conductor, the critical layers are physically separated from adjacent layers at regions surrounding an interior region of the stacked layers. The stacked layers at the interior region form an MRAM cell, while the separated edges prevent conductive layers from being formed along the sidewalls of the MRAM cell due to sputtering during the etching process(es) performed to define the cell.
申请公布号 US2004124456(A1) 申请公布日期 2004.07.01
申请号 US20030734202 申请日期 2003.12.15
申请人 MORGAN PAUL A. 发明人 MORGAN PAUL A.
分类号 G11C5/02;G11C11/15;H01L21/00;H01L27/22;H01L29/94;(IPC1-7):H01L21/00 主分类号 G11C5/02
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