| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an X-ray foreign matter inspection apparatus capable of easily determining a foreign matter corresponding to the shape of a vessel to be inspected. <P>SOLUTION: On a vessel conveyor 25 for conveying an inspection object, the inspection object is installed not vertically but in an obliquely tilted state relative to the moving direction of the vessel conveyor 25. Hereby, the X-ray penetration thickness is reduced, and a foreign matter is determined with an image processing device 7. <P>COPYRIGHT: (C)2004,JPO</p> |
