发明名称 METHOD FOR MANUFACTURING GROUP III NITRIDE COMPOUND SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To easily and stably carry out the cleavage of a sapphire substrate and a group III nitride compound semiconductor layer into an excellent mirror surface degree. SOLUTION: A buffer layer constituted of a group III nitride compound semiconductor is formed on a sapphire (a) face substrate by a spattering method, and a group III nitride compound semiconductor layer having element functions is formed on the buffer layer in a well-known method. Then, the m axis of the sapphire substrate and the m axis of the group III nitride compound semiconductor layer can be made in parallel with each other. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004179457(A) 申请公布日期 2004.06.24
申请号 JP20020345036 申请日期 2002.11.28
申请人 TOYODA GOSEI CO LTD 发明人 NAKAMURA AKIRA;TEZENI YUUTA;ITO JUN;USHIDA YASUHISA
分类号 H01L21/205;H01S5/02;H01S5/323;(IPC1-7):H01S5/02 主分类号 H01L21/205
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