发明名称 |
Method for cleaning a surface of a component of a lithographic projection apparatus, lithographic projection apparatus, device manufacturing method and cleaning system |
摘要 |
A cleaning system (100) for removing contamination (105) from at least a part of a surface (104) of a component (101) in a lithographic projection apparatus (1), comprising: a cleaning particle provider for providing cleaning particles near said surface, which cleaning particle provider comprises an electric field generator (106,V) for generating an electric field (107). Furthermore, a method for removing contamination (105) from at least a part of a surface (104) of a component (101) of a lithographic projection apparatus (1). <??>The method comprises generating an electric field in at least a part of the lithographic projection apparatus; providing cleaning particles near the contamination by means of said electric field (107); and removing said contamination via interaction of said cleaning particles with said contamination. Thereby, contamination (105) is removed from the surface (104).
|
申请公布号 |
EP1431828(A1) |
申请公布日期 |
2004.06.23 |
申请号 |
EP20030079145 |
申请日期 |
2003.12.22 |
申请人 |
ASML NETHERLANDS B.V.;CARL ZEISS SMT AG |
发明人 |
BAKKER, LEVINUS PETER;KURT, RALPH;MERTENS, BASTIAAN, MATTHIAS;WEISS, MARKUS;TRENKLER, JOHANN;SINGER, WOLFGANG |
分类号 |
B08B6/00;B08B7/00;G03F7/20;(IPC1-7):G03F7/20 |
主分类号 |
B08B6/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|