发明名称 Method for cleaning a surface of a component of a lithographic projection apparatus, lithographic projection apparatus, device manufacturing method and cleaning system
摘要 A cleaning system (100) for removing contamination (105) from at least a part of a surface (104) of a component (101) in a lithographic projection apparatus (1), comprising: a cleaning particle provider for providing cleaning particles near said surface, which cleaning particle provider comprises an electric field generator (106,V) for generating an electric field (107). Furthermore, a method for removing contamination (105) from at least a part of a surface (104) of a component (101) of a lithographic projection apparatus (1). <??>The method comprises generating an electric field in at least a part of the lithographic projection apparatus; providing cleaning particles near the contamination by means of said electric field (107); and removing said contamination via interaction of said cleaning particles with said contamination. Thereby, contamination (105) is removed from the surface (104).
申请公布号 EP1431828(A1) 申请公布日期 2004.06.23
申请号 EP20030079145 申请日期 2003.12.22
申请人 ASML NETHERLANDS B.V.;CARL ZEISS SMT AG 发明人 BAKKER, LEVINUS PETER;KURT, RALPH;MERTENS, BASTIAAN, MATTHIAS;WEISS, MARKUS;TRENKLER, JOHANN;SINGER, WOLFGANG
分类号 B08B6/00;B08B7/00;G03F7/20;(IPC1-7):G03F7/20 主分类号 B08B6/00
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