| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of detecting undersupply of a test element to be analyzed and a method of compensating for undersupply thereof if needed, and to provide an analyzing apparatus and a test element suitable for detecting undersupply. SOLUTION: The undersupply of the test element is surely detected and calculated if needed by irradiating the test element to be analyzed in the testing wavelength range. For that purpose, the element contains a test material which interacts with a radiation in the testing wavelength range depending on the contact with the amount of the sample supplied. COPYRIGHT: (C)2004,JPO
|
