发明名称 METHOD FOR FORMING BORDERLESS CONTACT HOLE
摘要 PURPOSE: A method for forming a borderless contact hole is provided to improve process margin by forming a nitride spacer at the sidewall of a trench. CONSTITUTION: A trench is formed at an isolation region by patterning a pad nitride layer, a pad oxide layer(20) and a substrate(10). An oxide layer is formed on the resultant structure. An isolation layer(50) is formed by planarizing the oxide layer to expose the pad nitride layer. A recess region is formed by partially removing the isolation layer. A nitride spacer(90) is formed at sidewalls of the recess region. An insulating layer(110) and an oxide layer(120) are sequentially formed on the resultant structure. A borderless contact hole(130) is formed by etching the oxide layer and the insulating layer.
申请公布号 KR20040037875(A) 申请公布日期 2004.05.08
申请号 KR20020066550 申请日期 2002.10.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 RYU, SANG UK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址