| 摘要 |
A method and apparatus is provided for testing a memory portion using a stress signal. The method comprises identifying a first and second portion of a memory, wherein a stress signal is to be applied to only the second portion of the memory. The first portion is isolated from exposure to a stress signal. A stress signal is provided to the second portion of said memory for testing said second portion of memory. The first portion of said memory is isolated from said stress signal. The method further comprises performing an alternate wordline testing process.
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