发明名称 Semiconductor manufacturing apparatus and its diagnosis apparatus and operating system
摘要 A sample processing apparatus having a main unit for processing a sample, a recorder for recording information of an operation in the main unit as predetermined data, which information includes a plurality of data corresponding to outputs of a plurality of sensors installed on the main unit, and a display unit for displaying each of the data corresponding to outputs of the sensors simultaneously.
申请公布号 US2004078946(A1) 申请公布日期 2004.04.29
申请号 US20030689594 申请日期 2003.10.22
申请人 NAKAMOTO SHIGERU;KONDO HIDEAKI;ARIMA JUNTARO 发明人 NAKAMOTO SHIGERU;KONDO HIDEAKI;ARIMA JUNTARO
分类号 G05B23/02;H01L21/00;(IPC1-7):H01L21/00 主分类号 G05B23/02
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