发明名称 JITTER-MEASURING APPARATUS AND TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a jitter-measuring apparatus which can measure the jitters of an output signal output from an electronic device, with a high speed and superior precision. SOLUTION: The jitter measuring apparatus measures jitters of the output signal output from the electronic device. A multi-strobe, having three or more strobes, is characterized by being equipped with a multi-strobe forming part, which performs forming multiple times synchronizing with an output signal which an electronic device outputs a multiple number times; a values detector for detecting the value of an output signal in each strobe of the multi-strobe, which the multi-strobe forming part forms multiple times; a variation point detector for detecting position of the variation point of values of each output signal; and a histogram forming part for counting the frequency wherein the variation point detector detects the variation point, each position of the variational point of values of each output signal. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004125552(A) 申请公布日期 2004.04.22
申请号 JP20020288799 申请日期 2002.10.01
申请人 ADVANTEST CORP 发明人 TANAKA KOICHI;NIIJIMA HIROKATSU
分类号 G01R29/02;G01R29/26;G01R31/28;G01R31/317;G01R31/3183;G01R31/319;(IPC1-7):G01R29/02;G01R31/318 主分类号 G01R29/02
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