发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor substrate for sufficiently relieving strain of an SiGe film and suppressing penetration dislocation on a region forming an element in the SiGe film formed on an Si substrate. SOLUTION: The semiconductor device forms the semiconductor substrate laminating the SiGe film 2 on a substrate Si substrate 1 (a), pattern-forms an ion implantation preventive film 3 on a region forming the element on the SiGe film (b), implants ions 4 to the semiconductor substrate forming the ion implantation preventive film 3 (c), generates the penetration dislocation caused by implantation ions except for a region forming the element by removing the ion implantation preventive film 3 and performing annealing processing (d), and prevents the penetration dislocation from generating on an element forming region. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004111638(A) 申请公布日期 2004.04.08
申请号 JP20020271887 申请日期 2002.09.18
申请人 SHARP CORP 发明人 TAKENAKA MASAHIRO
分类号 H01L29/167;H01L21/20;H01L21/205;H01L21/265;(IPC1-7):H01L21/20 主分类号 H01L29/167
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