发明名称 Method and apparatus to fabricate an on-chip decoupling capacitor
摘要 A method of fabricating a decoupling capacitor includes depositing a first barrier metal on a conducting metal. The first barrier metal acts as a first electrode of the decoupling capacitor. A dielectric is deposited on the first barrier metal. A second barrier metal is deposited on the dielectric. The second barrier metal acts as a second electrode of the decoupling capacitor. A photoresist is exposed to ultraviolet light. The photoresist is applied on the second barrier metal. A mask is utilized to define an approximate shape of the decoupling capacitor. A portion of the second barrier metal is etched. A quantity of the photoresist is removed.
申请公布号 US2004061197(A1) 申请公布日期 2004.04.01
申请号 US20020261225 申请日期 2002.09.30
申请人 INTEL CORPORATION 发明人 BLOCK BRUCE;THOMAS CHRISTOPHER
分类号 H01L21/02;H01L23/522;(IPC1-7):H01L29/00 主分类号 H01L21/02
代理机构 代理人
主权项
地址