发明名称 |
Method and apparatus to fabricate an on-chip decoupling capacitor |
摘要 |
A method of fabricating a decoupling capacitor includes depositing a first barrier metal on a conducting metal. The first barrier metal acts as a first electrode of the decoupling capacitor. A dielectric is deposited on the first barrier metal. A second barrier metal is deposited on the dielectric. The second barrier metal acts as a second electrode of the decoupling capacitor. A photoresist is exposed to ultraviolet light. The photoresist is applied on the second barrier metal. A mask is utilized to define an approximate shape of the decoupling capacitor. A portion of the second barrier metal is etched. A quantity of the photoresist is removed.
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申请公布号 |
US2004061197(A1) |
申请公布日期 |
2004.04.01 |
申请号 |
US20020261225 |
申请日期 |
2002.09.30 |
申请人 |
INTEL CORPORATION |
发明人 |
BLOCK BRUCE;THOMAS CHRISTOPHER |
分类号 |
H01L21/02;H01L23/522;(IPC1-7):H01L29/00 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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