发明名称 X-RAY ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To prevent a detecting means for detecting secondary X-rays generated from a sample, from detecting secondary X-rays outside of a detection object, generated from the interior of an X-ray tube. SOLUTION: This X-ray analysis apparatus is provided with the X-ray tube 5 for guiding primary X-rays (a) generated from an X-ray source 2, and the detecting means 7 for detecting the secondary X-rays (b) generated by irradiating the sample 10 with the primary X-rays (a) from the X-ray tube 5. A plate body 20a for suppressing the secondary X-rays (b) generated from the interior of the X-ray tube 5 is provided between the X-ray tube 5 and the detecting means 7 to prevent the detecting means 7 from detecting the secondary X-rays outside of the detection object, generated from the interior of the X-ray tube 5. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004093512(A) 申请公布日期 2004.03.25
申请号 JP20020258314 申请日期 2002.09.03
申请人 HORIBA LTD 发明人 OSAWA SUMUTO
分类号 G01N23/223;G21K1/06;G21K5/02;(IPC1-7):G01N23/223 主分类号 G01N23/223
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