发明名称 Material systems for semiconductor tunnel-junction structures
摘要 The tunnel junction structure comprises a p-type tunnel junction layer of a first semiconductor material, an n-type tunnel junction layer of a second semiconductor material and a tunnel junction between the tunnel junction layers. At least one of the semiconductor materials includes gallium (Ga), arsenic (As) and either nitrogen (N) or antimony (Sb). The probability of tunneling is significantly increased, and the voltage drop across the tunnel junction is consequently decreased, by forming the tunnel junction structure of materials having a reduced difference between the valence band energy of the material of the p-type tunnel junction layer and the conduction band energy of the n-type tunnel junction layer.
申请公布号 US2004051113(A1) 申请公布日期 2004.03.18
申请号 US20020243520 申请日期 2002.09.12
申请人 CHANG YING-LAN;TANDON ASHISH;LEARY MICHAEL H.;TAN MICHAEL R. T. 发明人 CHANG YING-LAN;TANDON ASHISH;LEARY MICHAEL H.;TAN MICHAEL R. T.
分类号 H01S5/042;H01S5/183;H01S5/323;H01S5/343;(IPC1-7):H01L29/88 主分类号 H01S5/042
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