发明名称 Silver selenide film stoichiometry and morphology control in sputter deposition
摘要 A method of sputter depositing silver selenide and controlling the stoichiometry and nodular defect formations of a sputter deposited silver-selenide film. The method includes depositing silver-selenide using a sputter deposition process at a pressure of about 0.3 mTorr to about 10 mTorr. In accordance with one aspect of the invention, an RF sputter deposition process may be used preferably at pressures of about 2 mTorr to about 3 mTorr. In accordance with another aspect of the invention, a pulse DC sputter deposition process may be used preferably at pressures of about 4 mTorr to about 5 mTorr.
申请公布号 US2004040835(A1) 申请公布日期 2004.03.04
申请号 US20020230279 申请日期 2002.08.29
申请人 LI JIUTAO;HAMPTON KEITH;MCTEER ALLEN 发明人 LI JIUTAO;HAMPTON KEITH;MCTEER ALLEN
分类号 C23C14/00;C23C14/06;C23C14/34;C23C14/54;C30B23/02;G11C11/34;(IPC1-7):C23C14/32;B32B19/00 主分类号 C23C14/00
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