发明名称 Apparatus for measuring information on particular component
摘要 An information measuring apparatus and a measuring method of a specific component are obtained that can achieve high signal strength without being affected by an interfering substance on a surface of a sample. The information measuring apparatus of a specific component comprises a light source 1, an ATR element 2 of emitting light from the light source 1 to a sample and receiving light returned from the sample, a photodetector 4 of detecting light returned to the ATR element, and a polarizer 3 set to permit passage of light of a P-polarized component more than light of other polarized components on an optical path between the light source 1 and the photodetector 4. Information such as a concentration of a specific component in the sample is measured according to light detected by the photodetector 4.
申请公布号 US2004024541(A1) 申请公布日期 2004.02.05
申请号 US20030415180 申请日期 2003.09.11
申请人 UCHIDA SHINJI;OOSHIMA KIYOKO 发明人 UCHIDA SHINJI;OOSHIMA KIYOKO
分类号 G01N21/21;G01N21/55;(IPC1-7):G06F19/00;G01N31/00 主分类号 G01N21/21
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