发明名称 |
Apparatus for measuring information on particular component |
摘要 |
An information measuring apparatus and a measuring method of a specific component are obtained that can achieve high signal strength without being affected by an interfering substance on a surface of a sample. The information measuring apparatus of a specific component comprises a light source 1, an ATR element 2 of emitting light from the light source 1 to a sample and receiving light returned from the sample, a photodetector 4 of detecting light returned to the ATR element, and a polarizer 3 set to permit passage of light of a P-polarized component more than light of other polarized components on an optical path between the light source 1 and the photodetector 4. Information such as a concentration of a specific component in the sample is measured according to light detected by the photodetector 4.
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申请公布号 |
US2004024541(A1) |
申请公布日期 |
2004.02.05 |
申请号 |
US20030415180 |
申请日期 |
2003.09.11 |
申请人 |
UCHIDA SHINJI;OOSHIMA KIYOKO |
发明人 |
UCHIDA SHINJI;OOSHIMA KIYOKO |
分类号 |
G01N21/21;G01N21/55;(IPC1-7):G06F19/00;G01N31/00 |
主分类号 |
G01N21/21 |
代理机构 |
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主权项 |
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