发明名称 METHOD FOR FABRICATING METAL INTERCONNECTION
摘要 PURPOSE: A method for fabricating a metal interconnection is provided to improve planarization of a plating layer in an electro-polishing process by forming an Au layer under the plating layer. CONSTITUTION: An interlayer dielectric(12) is formed on a semiconductor substrate(10) to form a pattern. A barrier metal layer(14) and a seed layer(16) are formed in the pattern. A metal layer is formed on the resultant structure. The plating layer is formed in the pattern by an electroplating process. The plating layer is polished by an electro-polishing process.
申请公布号 KR20040009253(A) 申请公布日期 2004.01.31
申请号 KR20020043127 申请日期 2002.07.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, GYE DONG;CHOI, SEUNG MAN;LEE, HYO JONG;LEE, SEON JEONG;PARK, GI CHEOL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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