发明名称 TEST SAMPLE ANALYZER BY USING ULTRAVIOLET RAY-VISIBLE RAY SPECTRUM
摘要 PURPOSE: A test sample analyzer is provided to reduce costs required for analyzing a test sample by analyzing the test sample by using an ultraviolet ray-visible ray spectrum. CONSTITUTION: After inputting a test sample in a test sample storing section, the test sample is conveyed into a test sample detecting section(27) of a microchip section(26) by using an electrophoresis method. At this time, a lamp(20) selectively radiates ultraviolet ray or visible ray in such a manner that the ultraviolet ray or visible ray is collected on an upper lens(24) through an interference filter(22). Scattered light is removed through an upper slit(25) and collected light is introduced into the test sample detecting section(27) of the microchip section(26). Then, light is collected on a lower lens(29) through a lower slit(28) and is introduced into a light amplifier(32).
申请公布号 KR20040009186(A) 申请公布日期 2004.01.31
申请号 KR20020043032 申请日期 2002.07.22
申请人 KIM, YONG SEONG;OPTRON-TEC CO., LTD. 发明人 KONG, JIN
分类号 G01J3/02 主分类号 G01J3/02
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