发明名称 XY STAGE AND ELECTRON MICROSCOPE APPARATUS
摘要 PROBLEM TO BE SOLVED: To achieve an XY stage for electron microscopes having a small precision decrease also to the distortion of a base by achieving a high-magnification observation in a light and simple structure. SOLUTION: On the XY stage for electron microscopes, a wafer table is supported on a horizontal guidance surface by three two-dimensional ultrasonic motors having a wafer table, and the wafer table is connected to the edge section of the base by a linking mechanism so that the wafer table can make only a parallel movement without accompanying any rotations. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004031537(A) 申请公布日期 2004.01.29
申请号 JP20020183965 申请日期 2002.06.25
申请人 HITACHI HIGH TECH CORP 发明人 SEYA HIDEKAZU;NAKAGAWA SHUICHI
分类号 H01J37/20;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01J37/20
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