| 发明名称 |
Method and apparatus for testing analog to digital converters |
| 摘要 |
A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.
|
| 申请公布号 |
US2004000899(A1) |
申请公布日期 |
2004.01.01 |
| 申请号 |
US20020185811 |
申请日期 |
2002.06.28 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
TANGHE STEVEN J.;VON BRUNS SHARON L. |
| 分类号 |
H03M1/10;H03M1/12;(IPC1-7):G01R13/14 |
主分类号 |
H03M1/10 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
