发明名称 Method of automatically generating schematic and waveform diagrams for isolating faults from multiple failing paths in a circuit using input signal predictors and transition times
摘要 Relevant logic cells and waveforms of a circuit are automatically identified, traced and displayed by using conventional simulation, schematic viewing and waveform viewing tools. The input and output waveforms to and from each logic cell and a transition and a transition time point of each waveform are derived. The output waveform and a selected transition time point identify a predictive input waveform and its transition time which cause the output signal transition at the selected transition time point. The predictive input signal is the output signal of a preceding, predictive logic cell, thereby identifying the preceding predictive logic cell. Repetitions of this procedure are performed with each new identified predictive logic cell to automatically derive a series or logic cone of cells. A different logic cone is derived for each of the multiple failing output signals at output pads. The convergence or intersection point of the multiple logic cones indicates the probable cause of faulty components of the circuit.
申请公布号 US6671846(B1) 申请公布日期 2003.12.30
申请号 US20000684770 申请日期 2000.10.06
申请人 LSI LOGIC CORPORATION 发明人 SCHULTZ RICHARD T.
分类号 G01R31/3183;G06F11/26;G06F17/50;(IPC1-7):G01R31/28;G06F11/00 主分类号 G01R31/3183
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