Method and apparatus for fault injection using boundary scan for pins enabled as outputs

摘要

Structure and associated methods of operation for an enhanced boundary scan register structure in an integrated circuit that permits flexible application of stuck-at faults or normal operation on each I/O pad of the IC. Each pad may be individually controlled to force a desired stuck-at fault or may be permitted to operate normally. The additional structure integrates with existing boundary scan register structures to minimize the need for additional logic and latches as compared to prior techniques and to minimize additional globally routed signals. Additional commands decoded by TAP command processing provides desired specialized control for the enhanced boundary scan register.